Byte | Description | Value |
---|
Byte 0 | Number of Serial PD Bytes written during module production
The most common for standard 184pin DIMM and 200pin SODIMM is 128 bytes written although some special modules and manufacturer would occasionally insert different number. | 128 Byte 80h
255 Byte FFh |
Byte 1 | Total number of Bytes in Serial PD device
This is referring to the EEPROM size used. For standard 184pin DIMM and 200pin SODIMM, device used is usually 128 Bytes or 256 Bytes with 256 Bytes as the most common. | 128 Byte (24C01) 07h
256 Byte (24C02) 08h |
Byte 2 | Fundamental Memory Type
This refers to the DRAM type. The most common now-a-days are either SDRAM or DDR. In this case, we are only dealing with DDR | 00h reserved
01h Standard FPM DRAM
02h EDO
03h Pipelined Nibble
04h SDRam
07h DDR (recommended default)
08h DDR2 SDRam |
Byte 3 | Number of Row Addresses on this assembly
This relates to the DRAM size as well as the Refresh scheme of the DRAM. The best way to discover this is to use the AutoID function of the CST DIMM tester. You would first run the AutoID on the tester. You then use the [Edit] [AdrDat] function to display the Row and Column Address counts. | 0Dh 13
0Ch 12
0Bh 11
0Ah 10
09h 9 |
Byte 4 | Number of Column Addresses on this assembly
This relates to the DRAM size as well as the Refresh scheme of the DRAM. The best way to discover this is to use the AutoID function of the CST DIMM tester. You would first run the AutoID on the tester. You then use the [Edit] [AdrDat] function to display the Row and Column Address counts. | 0Dh 13
0Ch 12
0Bh 11
0Ah 10
09h 9 |
Byte 5 | Number of Physical Banks on DIMM
This is referring to the internal banks (or ranks) on the module. Normally, you can count the number of chips on the module and make a guest that there would be one bank (rank) for each 8 pieces of DRAM chips. However, downgrade modules often use two defective chips to replace one. Stacked modules also uses two chip stacked as one physical chip. Those would make the identification very complex. The best way to identify the banks (ranks) would be to use the AutoID function in the CST testers. The tester displays number of internal Banks directly after AutoID is executed. | 01h 1Bank
02h 2Banks
03h 3Banks
04h 4Banks |
Byte 6 | Module Width of this assembly
This refers to the number of data bit width on the module. For a standard 8 byte DIMM, 64 bits would be most common while an 8 byte ECC module would have 72 bits. Some special module might even have up to 144 bits. In any case, a CST tester AutoID function would tell you this number in plan English. | 40h 64bit
48h 72bit
90h 144bit |
Byte 7 | Module width of this assembly (Continue)
This byte is used only if your DIMM exceeds 16 bytes (144 bits). | additional bit 00h recommended default |
Byte 8 | Voltage Interface Level of this assembly
This refers to the power supply voltage Vdd of the DIMM. Standard DDR module would be 2.5V SSTL | 03h 3.3V SSTL
04h 2.5V SSTL DDR recommended default
05h 1.8V SSTL |
Byte 9 | SDRAM Device Cycle time at Maximum Supported CAS Latency (ns)
This commonly referred to the clock frequency of the DIMM. Running at its specified CL latency. The higher order nibble (bits 4-7) designates the cycle time to a granularity of 1ns; the value presented by the lower order nibble (bits 0-3) has a granularity of .1ns and is added to the value designated by the higher nibble.
Example: 75h -> 7xh = 7ns and x5h = +0.5ns -> 7.5ns | 75h 266MHz data rate DDR
60h 333MHz data rate DDR
50h 400MHz data rate DDR
46h 433MHz data rate DDR
42h 466MHz data rate DDR |
Byte 10 | SDRAM Device Access from Clock (tAC)
This is referred to the data valid time from the clock. This can be read directly from the DRAM manufacturer data sheet. But caution must be taken to read off the correct column since this is CL (clock latency) related. In the DDR data sheet, it is listed as tAC and is in fraction of a nano-second (ns).
Example: 75h -> 7xh = 0.7ns and x5h = +0.05ns -> 0.75ns | +/-0.6ns 60h
+/-0.65ns 65h
+/- 0.7ns 70h
+/-0.75ns 75h |
Byte 11 | DIMM Configuration Type
This is to identify the DIMM as ECC, Parity, or Non-parity. Normally non-parity is related to 64 bit module, Parity and ECC are related to 72 bit or higher memory bit width on the module. | 00h Non ECC
01h Parity
02h ECC |
Byte 12 | Refresh Rate/Type
This byte describes the module’s refresh rate and if it is self-refreshing or non-self refreshing. Today, most standard modules would be capable of self-refreshing. The refresh time is easily read from the DRAM manufacturer data sheet. Refresh time can be listed in two different ways.
1. In Refresh Interval Time. For example: 15.6usec. or 7.8usec.
2. In milli-seconds per x Refresh Cycles. For example: 62.4ms in 8K refresh cycles.
This can be converted back into refresh interval time with the equation:
Refresh Interval = Total Refresh Period / number of refresh cycles | 80h 15.6 usec. Self-refresh (4K)
82h 7.8 usec. Self-refresh (8K) |
Byte 13 | Primary SDRAM Width
This refers to the bit width of the DDR DRAM for a standard DIMM module. | 04h 4 bits
08h 8 bits
10h 16 bits |
Byte 14 | Error Checking SDRAM Width
This refers to the bit width of the error checking DRAM. For a standard module, it is either no ECC bit, 8 bits, or 16 bits on a 144 bit module. | 00h 0 bit
08h 8 bits
10h 16bits |
Byte 15 | Minimum Clock Delay, Back-to-Back Random Column Access (tCCD min).
This is read off the tCCD min column of the DRAM data sheet and is in the unit of clock cycles. For the most case, it is 1 clock cycle. | 1 clock cycle 01h
2 clock cycle 02h |
Byte 16 | Burst Lengths Supported
This is indicates the burst length supported. In most case, it is 2,4,8 burst supported. | 2, 4,8 Burst length supported 0Eh recommended default |
Byte 17 | Number of Banks on SDRAM Device
This is referring to the internal bank on the DRAM chip. All modern DDR have 4 internal banks. | 4 Internal Banks 04h recommended default |
Byte 18 | CAS Latency (CL)
This refers to the all the different Cas Latency supported by your chip. This can vary with the frequency you operate your DIMM. This number can be read off your DRAM data sheet. | CL=2.5 and 3 supported 18h
CL=2.0, 2.5 and 3 are all supported 1Ch |
Byte 19 | Chip Select Latency
This is the maximum time between the activation of CS to the time the Chip Select is effective. This is counted in number of clock cycles. For modern DRAM, this number is 0 clock cycle. | 0 clock cycle 01h recommended default |
Byte 20 | Write Latency
This is the maximum time between the activation of WE to the time that writing is effective. This is counted in number of clock cycles. For most modern DDR SDRAM, this number is 1 clock cycle. | 1 clock cycle 02h recommended default |
Byte 21 | SDRAM Module Attributes
This byte describes the DIMM, whether it is unbuffered, registered, differential clocked or with FET switches. | Unbuffer DDR DIMM with differential clock 20h
Registered DDR DIMM 26h |
Byte 22 | SDRAM Device Attributes
This byte describes the DRAM specification on voltage tolerance, the type of pre-charge supported, plus support of dual strength drivers. Modern DRAM are standardized on these features. These features are usually found on the feature list of the DRAM specification sheet. | DDR (Fast AP, Concurrent AP supported) C0h recommended default |
Byte 23 | SDRAM Minimum Clock Cycle Time Derated by Half a Clock
This is referred to the speed the DRAM can run at when the Cas Latency is reduced by 0.5 clock. This data can be looked up from the datasheet of the DRAM. This is usually listed at the first page of the data sheet where it mentioned highest frequency it can run at a certain cas latency setting. | With 0.5 CL derate, it would work as a DDR200 A0h
With 0.5 CL derate, it would work as a DDR266 75h
With 0.5 CL derate, it would work as a DDR333 60h
Derated operation not allowed 00h |
Byte 24 | Data Access Time from clock when CL is Derated by Half a Clock (derated tAC)
This is referred to the tAC (access time) the DRAM can run at when the Cas Latency is reduced by 0.5 clock. This data can be looked up from the datasheet of the DRAM. This is usually listed at the first page of the data sheet where it mention maximum frequency it can run at a certain cas latency setting. | +/-0.65 ns 65h
+/- 0.7 ns 70h
+/-0.75 ns 75h
Derated operation not allowed 00h |
Byte 25 |
SDRAM Minimum Clock Cycle when CL is Derated by One Clock
This is referred to the speed the DRAM can run at when the Cas Latency is forced to reduce by two notches. (that is 1 clock for DDR) This data can be looked up from the datasheet of the DRAM. This is usually listed at the first page of the data sheet where it mentioned what frequency it can run at a certain cas latency setting. | DDR 400 CL3 cannot be degraded to lower than CL2.5 as listed in Byte 18 00h
With 1 CL derate, it would work as a DDR200 A0h
With 1 CL derate, it would work as a DDR266 75h
With 1 CL derate, it would work as a DDR333 60h
Derated operation not allowed 00h |
Byte 26 | Data Access Time from clock when CL is Derated by One Clock. (derated tAC)
This is referred to the tAC (access time) the DRAM can run at when the Cas Latency is derated by 1 clock. This data can be looked up from the datasheet of the DRAM. This is usually listed at the first page of the data sheet where it mentions the maximum frequency it can run at a certain cas latency setting. | +/-0.65 ns 65h
+/- 0.7 ns 70h
+/-0.75 ns 75h
Derated operation not allowed 00h |
Byte 27 | Minimum Row Pre-charge Time (tRP)
This is tRP read off the DRAM data sheet. | 12ns 30h
15ns 3Ch
18ns 48h
20ns 50h |
Byte 28 | Minimum Row to Row Access Delay (tRRD)
This is the tRRD time read off the DRAM data sheet | 10ns 28h
12ns 30h
15ns 3Ch |
Byte 29 | Minimum Ras to Cas Delay (tRCD)
This is the tRCD time read off the DRAM data sheet. | 12ns 30h
15ns 3Ch
18ns 48h
20ns 50h |
Byte 30 | Minimum Active to Pre-charge Time (tRAS)
This is the tRAS time read off the DRAM data sheet. | 40ns 28h
45ns 2Dh
50ns 32h
55ns 37h |
Byte 31 | Module Bank Density
This refers to the Mega-Byte in each physical bank (rank) on the DIMM. For example: if a 256MB module has two physical banks, then each physical bank should have 128MB. | 32 MB 08h
64MB 10h
128MB 20h
256MB 40h
512MB 80h |
Byte 32 | Address and Command Input Setup Time Before Clock (tIS)
This refers to the time of the address and command lines have to occur before the next clock edge. It is labeled as tIS in the case of DDR.
(tIS) | 0.6ns. 60h
0.8ns 80h
1.0ns. A0h |
Byte 33 | Address and Command Input Hold Time After Clock (tIH)
This refers to the period of time the address and command lines have to hold after the last clock edge has appeared. It is labeled as tSH in SDRAM and tIH in the case of DDR.
(tIH) | 0.4ns. 40h
0.6ns. 60h
0.8ns. 80h
1.0ns. A0h |
Byte 34 | SDRAM Device Data/Data Mask Input setup Time Before Data Strobe (tDS)
This refers to the time of the Data and Data Mask lines have to occur before the next clock edge. It is labeled as tDS in the case of DDR.
(tDS) | 0.4ns. 40h
0.6ns 60h
0.8ns. 80h |
Byte 35 | Address and Command Input Hold Time After Clock (tDH)
This refers to the period of time the Data and Data Mask lines have to hold after the last clock edge has appeared. It is labeled as tDH in the case of DDR.
(tDH) | 0.4ns. 40h
0.6ns. 60h
0.8ns. 80h
1.0ns. A0h |
Byte 36-40 | Reserved for Virtual Channel SDRAM | Normally Not VC SDRAM 00h |
Byte 41 | Minimum Active to Active Auto Refresh Time (tRC) | 55ns 37h
60ns 3Ch
65ns 41h
70ns 46h |
Byte 42 | Minimum Auto Refresh to Active Auto Refresh Time (tRFC) | 70ns 46h
75ns 4Bh |
Byte 43 | Maximum Device Cycle time (tCKmax) | 10ns 28h
12ns 30h |
Byte 44 | Maximum Skew Between DQS and DQ (tDQSQ)
Maximum DQS tolerance | 0.4ns 28h
0.5ns 32h
0.6ns 3Ch |
Byte 45 | Maximum Read DataHold Skew Factor (tQHS)
Maximum DQS and DQ window tolerance. | 0.5ns 32h
0.6ns 3Ch |
Byte 46 | PLL Relock Time | Not available 00h recommended default |
Byte 47-61 | Superset Information | Not available 00h recommended default |
Byte 62 | SPD Data Revision Code | Revision 0.0 00h
Revision 1.0 10h
Revision 2.0 20h |
Byte 63 | Checksum for Byte 0 to 62
Checksum is calculated and placed into this byte. All CST testers have automatic checksum calculation for this byte. All you have to do is to fill in and audit byte 0-62, the tester will automatically fill in byte 63 for you through the auto-checksum calculation. | N/A |
Byte 64-71 | Manufacturer’s JEDEC ID Code
This is a code obtained through manufacturer’s registration with JEDEC ( the standard setting committee). A small fee is charged by JEDEC to support and maintain this record. Please contact JEDEC office.
Byte 64 is the most significant byte. If the ID is not larger then one byte (in hex), byte 65-71 should be filled with 00h. | N/A |
Byte 72 | Module manufacturing Location
Optional manufacturer assigned code. | N/A |
Byte 73-90 | Module Part Number
Optional manufacturer assigned part number.
The manufacturer’s part number is written in ASCII format within these bytes. Byte 73 is the most significant digit in ASCII while byte 90 is the least significant digit in ASCII. Unused digits are coded as ASCII blanks (20h).
| N/A |
Byte 91-92 | Module Revision Code
Optional manufacturer assigned code. | |
Byte 93-94 | Module Manufacturing Date | Byte 93 is the year:
2002 66h
2003 67h
2004 68h
Byte 94 is the week of the year:
wk1-wk15 01h – 0Fh
wk16-wk31 10h – 1Fh
wk32-wk47 20h – 2Fh
wk48-wk52 30h – 34h |
Byte 95-98 | Module Serial Number
Optional manufacturer assigned number.
On the serial number setting, JEDEC has no specification on the data format nor dictates the location of Most Significant Bit. Therefore, it’s up to individual manufacturer to assign his numbering system. All CST testers and EZ-SPD programmers have the option for user to select either byte 95 or byte 98 as the MSB (most significant bit). The testers assume the use of ASCII format; which is the most commonly used. The CST testers also have the function to automatically increment the serial number on each module tested. | N/A |
Byte 98-127 | Manufacturer’s Specific Data
Optional manufacturer assigned data. | N/A |
Byte 128-255 | Open for Customer Use
Optional for any information codes. | N/A |